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负载型钯催化剂的硫中毒机理—硫对催化剂上CO吸附性质的影响
Department非现建制
肖天存; 安立敦; 李灿; 辛勤
1992
Source Publication分子催化
ISSN1001-3555
Volume6Issue:1Pages:1-7
Abstract制备了负载型Pd/Al2O3和Pd/MgO催化剂, 借助于CO探针分子, 用原位FT-IR研究了不同状态的硫对催化剂上活性组分的影响, 结果表明, 吸附在多位活性中心上的硫(一般是不可逆吸附硫)除了屏蔽本身所在的活性点外, 对周围单活性中心还具有电子效应; 吸附在单活性中心上的硫(主要为可逆吸附硫), 主要以屏蔽效应影响催化剂的性质, 载体上的硫对活性组分的电子状态具有一定的影响。
Keyword硫中毒机理 负载型钯催化剂 Pd/al2o3 Pd/mgo Pd/tio2 Mechanism Sulfur Poisoning Supported Palladium Catalysts
Subject Area物理化学
Funding Organization国家自然科学基金资助项目
Language中文
Document Type期刊论文
Identifierhttp://ir.licp.cn/handle/362003/6426
Collection非现建制
Corresponding Author安立敦
Recommended Citation
GB/T 7714
肖天存,安立敦,李灿,等. 负载型钯催化剂的硫中毒机理—硫对催化剂上CO吸附性质的影响[J]. 分子催化,1992,6(1):1-7.
APA 肖天存,安立敦,李灿,&辛勤.(1992).负载型钯催化剂的硫中毒机理—硫对催化剂上CO吸附性质的影响.分子催化,6(1),1-7.
MLA 肖天存,et al."负载型钯催化剂的硫中毒机理—硫对催化剂上CO吸附性质的影响".分子催化 6.1(1992):1-7.
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