Electronic conductive and corrosion mechanisms of dual nanostructure CuCr-doped hydrogenated carbon films for SS316L bipolar plates
Department中国科学院材料磨损与防护重点实验室/先进润滑与防护材料研究发展中心
Qian Jia1; Zhixing Mu2; Xingkai Zhang1; Bin Zhang1; Ruixuan Liu2; Kaixiong Gao1; Yuanlie Yu1; Zhenguo Lai1; Junyan Zhang1
The second department607组
2021
Source PublicationMaterials Today Chemistry
Issue21Pages:100521-100532
If7.6128
compositor第一作者单位
Document Type期刊论文
Identifierhttp://ir.licp.cn/handle/362003/29979
Collection中国科学院材料磨损与防护重点实验室/先进润滑与防护材料研究发展中心
Corresponding AuthorBin Zhang
Affiliation1.中国科学院兰州化学物理研究所, 材料磨损与防护科技重点实验室
2.山西大学分子科学研究所晶体材料研究所
3.兰州理工大学石油化工学院
Corresponding Author AffilicationLanzhou Institute of Chemical Physics,Chinese Academy of Sciences
Recommended Citation
GB/T 7714
Qian Jia,Zhixing Mu,Xingkai Zhang,et al. Electronic conductive and corrosion mechanisms of dual nanostructure CuCr-doped hydrogenated carbon films for SS316L bipolar plates[J]. Materials Today Chemistry,2021(21):100521-100532.
APA Qian Jia.,Zhixing Mu.,Xingkai Zhang.,Bin Zhang.,Ruixuan Liu.,...&Junyan Zhang.(2021).Electronic conductive and corrosion mechanisms of dual nanostructure CuCr-doped hydrogenated carbon films for SS316L bipolar plates.Materials Today Chemistry(21),100521-100532.
MLA Qian Jia,et al."Electronic conductive and corrosion mechanisms of dual nanostructure CuCr-doped hydrogenated carbon films for SS316L bipolar plates".Materials Today Chemistry .21(2021):100521-100532.
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